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Johnston, Allan 4 0

Reliability and radiation effects in compound semiconductors / 6 6 Allan Johnston. - - - xii, 363 pages : illustrations 24 cm. - - - - - . - . - 0 . - . - 0 .



Includes bibliographical references and index.

Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles.

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ISBN: 9789814277105 (hardback)

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LCCN: 2011290141

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LC Class. No.: TK7871.99.C65 / J64 20102

Dewey Class. No.: GS 621.38152 J641r 2010 / 222

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