Point defects in semiconductors / M. Lannoo, J. Bourgoin. 6
By: Lannoo, M. 4 0 (Michel),16 [, ] | [, ] |
Contributor(s): 5 6 [] |
Language: Unknown language code Summary language: Unknown language code Original language: Unknown language code Series: Springer series in solid-state sciences 22, 35; Berlin ;;New York : Springer-Verlag, 198146Edition: Description: 24 cm. 2 v. : illContent type: text Media type: 2 Carrier type: volumeISBN: 0387105182 (U.S. : v. 1);0387115153 (U.S. : v. 2)ISSN: 2Other title: 6 []Uniform titles: | | Subject(s): -- 2 -- 0 -- -- | -- 2 -- 0 -- 6 -- | 2 0 -- | -- -- 20 -- | | -- -- Defects. Semiconductors;Point defects. -- -- 20 -- | -- -- -- 20 -- --Genre/Form: -- 2 -- Additional physical formats: DDC classification: | 537.6/22 LOC classification: | QC611.6.D4 | L362Other classification:| Item type | Current location | Home library | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
| Book | PLM | PLM Circulation Section | Circulation-Circulating | 537.622L284p (Browse shelf) | Available | C16237 |
Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins. 56
Includes bibliographical references and index.
1. Theoretical aspects -- 2. Experimental aspects.
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