Nonlinear Dynamic data reconciliation and Bias estimation of process measurements in an adiabatic stirred-tank reactor 6
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Contributor(s): Philippine Engineering Journal. v37,n21 (June2016): pp. 1-22 5 6 [] |
Language: Unknown language code Summary language: Unknown language code Original language: Unknown language code Series: ; 46Edition: Description: Content type: text Media type: unmediated Carrier type: volumeISBN: ISSN: 2Other title: 6 []Uniform titles: | | Subject(s): -- 2 -- 0 -- -- | -- 2 -- 0 -- 6 -- | 2 0 -- | -- -- 20 -- | | -- -- DATA RECONCILIATION;ADIABATIC -- BIAS ESTIMATION;ERROR DETECTION -- -- | -- -- -- 20 -- --Genre/Form: -- 2 -- Additional physical formats: DDC classification: | LOC classification: | | 2Other classification:| Item type | Current location | Home library | Collection | Call number | Status | Date due | Barcode | Item holds |
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| Book | PLM | PLM Periodicals Section | Periodicals | TA1.P538 (Browse shelf) | Available | PER1928G |
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ABSTRACT: When process data is taken from the sensors of a plant, errors of varying degrees are inherent. Measured variables will must likely violate dynamic process models. Because of this, large volumes of data may be unreliable for process control, monitoring, and optimizations. This paper describes a new method for simultaneous. Nonlinear dynamic data reconciliation and gross error detection (NDDR-GED) which conditions raw, sensor measurements and estimates bias in faulty sensors. The problem is formulated as a dynamic NLP, solved using a hybrid nelder-mead simplerx particle swarm optimization (NM-PSO) algorithm and moving horizon approach. The use of NM-PSO warrants the transfer of solutions, embedded in each elite particle, from one horizon NLP to the next, thereby promoting smoother profiles and faster convergence. This new feature seen to be a learning mechanism of the method across time. Discretization of ODEs was done using orthogonal collocation on finite elements. Using simulated data from the nonlinear process model of an adiabatic CSTR, the resulting profiles were both smooth (with a percent standard deviation reduction is measurement error of 80-90%) and accurate to the process model within 10-7 Also large biases were corrected accordingly, if the faulty sensor was known a priori. 56
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