Lannoo, M.  4  0  1942- <br/><br/>
Point defects in semiconductors /        6 
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M. Lannoo, J. Bourgoin. 
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 - 2 v. :  ill.   24 cm.     
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 - Springer series in solid-state sciences       22, 35   .
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<br/><br/>   Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>1. Theoretical aspects -- 2. Experimental aspects.       
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<br/><br/><label>ISBN: </label>0387105182 (U.S. : v. 1);0387115153 (U.S. : v. 2)   
<br/><br/><label>ISSN: </label>2 
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<br/><br/><label>LCCN: </label>81005354 
<br/><br/><label>Nat. Bib. No.: </label> 2 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>    
<br/><br/><label>Subjects--Personal Names: </label><br/>     2     --0------
<br/><br/><label>Subjects--Corporate Names: </label><br/>     6 --0-- 2 --------
<br/><br/><label>Subjects--Meeting Names: </label><br/><br/> 0    2 --
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<br/><br/><label>Subjects--Chronological Terms: </label><br/> 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors;Point defects.    ----Defects.----20--
<br/><br/><label>Subjects--Geographic Terms: </label><br/>--------20--
<br/><br/><label>Index Terms--Genre/Form: </label><br/>----2
<br/><br/><label>LC Class. No.: </label>QC611.6.D4  / L362 
<br/><br/><label>Dewey Class. No.: </label>537.6/22  / 219 
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