TY  - BOOK
AU  - Lannoo, M.
AU  - Bourgoin, J.
ED  - 
ED  - 
ED  - 
ED  - 
SN  - 0387105182 (U.S. : v. 1);0387115153 (U.S. : v. 2)
SN  - 2
PY  - 1981///46
CY  - Berlin ;;New York
PB  - Springer-Verlag
KW  - 
KW  - 2
KW  - 0
KW  - 6
KW  - 20
KW  - Defects
KW  - Semiconductors;Point defects
N1  - Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins; Includes bibliographical references and index; 1. Theoretical aspects -- 2. Experimental aspects; 5
ER  -